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 BUZ 21
SIPMOS (R) Power Transistor
* N channel * Enhancement mode * Avalanche-rated
Pin 1 G
Pin 2 D
Pin 3 S
Type BUZ 21
VDS
100 V
ID
21 A
RDS(on)
0.085
Package TO-220 AB
Ordering Code C67078-S1308-A2
Maximum Ratings Parameter Continuous drain current Symbol Values 21 Unit A
ID IDpuls
84
TC = 25 C
Pulsed drain current
TC = 25 C
Avalanche current,limited by Tjmax Avalanche energy,periodic limited by Tjmax Avalanche energy, single pulse
IAR EAR EAS
21 11 mJ
ID = 21 A, VDD = 25 V, RGS = 25 L = 340 H, Tj = 25 C
Gate source voltage Power dissipation 100
VGS Ptot
20 75
V W
TC = 25 C
Operating temperature Storage temperature Thermal resistance, chip case Thermal resistance, chip to ambient DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1
Semiconductor Group
Tj Tstg RthJC RthJA
-55 ... + 150 -55 ... + 150 1.67 75 E 55 / 150 / 56
C K/W
1
01/97
BUZ 21
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Static Characteristics Drain- source breakdown voltage Values typ. max. Unit
V(BR)DSS
100 3 0.1 10 10 0.065 4
V
VGS = 0 V, ID = 0.25 mA, Tj = 25 C
Gate threshold voltage
VGS(th)
2.1
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
IDSS
1 100
A
VDS = 100 V, VGS = 0 V, Tj = 25 C VDS = 100 V, VGS = 0 V, Tj = 125 C
Gate-source leakage current
IGSS
100
nA 0.085
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
RDS(on)
VGS = 10 V, ID = 13 A
Semiconductor Group
2
01/97
BUZ 21
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Transconductance Values typ. max. Unit
gfs
8 11 1000 300 150 -
S pF 1300 530 240 ns 25 40
VDS 2 * ID * RDS(on)max, ID = 13 A
Input capacitance
Ciss Coss
-
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
Crss
-
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
td(on)
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Rise time
tr
50 75
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Turn-off delay time
td(off)
160 210
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Fall time
tf
80 110
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Semiconductor Group
3
01/97
BUZ 21
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Reverse Diode Inverse diode continuous forward current IS TC = 25 C Inverse diode direct current,pulsed A 1.3 150 0.48 21 84 V 1.7 ns C Values typ. max. Unit
ISM VSD trr Qrr
TC = 25 C
Inverse diode forward voltage
VGS = 0 V, IF = 42 A
Reverse recovery time
VR = 30 V, IF=lS, diF/dt = 100 A/s
Reverse recovery charge
VR = 30 V, IF=lS, diF/dt = 100 A/s
Semiconductor Group
4
01/97
BUZ 21
Power dissipation Ptot = (TC)
Drain current ID = (TC) parameter: VGS 10 V
22 A
80
W
Ptot
ID
60
18 16 14 12
50
40 10 30 8 6 20 4 10 0 0 2 0 20 40 60 80 100 120 C 160 0 20 40 60 80 100 120 C 160
TC
TC
Safe operating area ID = (VDS) parameter: D = 0.01, TC = 25C
10 3
Transient thermal impedance Zth JC = (tp) parameter: D = tp / T
10 1
A
K/W
ID
10 2
/ID =
t = 22.0s p
S
ZthJC
10 0
VD
100 s
R
10 1
n) (o DS
1 ms
10 -1 D = 0.50
10 ms
0.20 0.10
10 0 DC
10 -2
0.05 0.02 0.01 single pulse
10
-1
10
0
10
1
V 10
2
10
-3
10
-7
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
0
VDS
tp
Semiconductor Group
5
01/97
BUZ 21
Typ. output characteristics ID = (VDS) parameter: tp = 80 s
50 A
Typ. drain-source on-resistance RDS (on) = (ID) parameter: tp = 80 s, Tj = 25 C
0.26
a b c d e
Ptot = 75W l
kj i h
VGS [V]
0.22
a 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 9.0 10.0 20.0
ID
40
g
b c d
RDS (on) 0.20
0.18 0.16 0.14 0.12 0.10 0.08 0.06 0.04
VGS [V] =
a 5.0 4.5 4.0 b 5.5 c 6.0 d 6.5 e f 7.0 7.5 g 8.0 h i j 9.0 10.0 20.0
35 30 25
e
e
ff
g h i j
f g h i j
20 15 10 5 0 0
a c d
k l
b
0.02 1 2 3 4 5 6 7 V 9 0.00 0
5
10
15
20
25
30
35
A
45
VDS
ID
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 s VDS2 x ID x RDS(on)max
60 A 50
parameter: tp = 80 s, VDS2 x ID x RDS(on)max
20 S
ID
45 40 35 30 25 20
gfs
16 14 12 10 8 6
15 4 10 5 0 0 1 2 3 4 5 6 7 8 V 10 2 0 0 10 20 30 40
VGS
A ID
55
Semiconductor Group
6
01/97
BUZ 21
Drain-source on-resistance RDS (on) = (Tj ) parameter: ID = 13 A, VGS = 10 V
0.28
Gate threshold voltage VGS (th) = (Tj) parameter: VGS = VDS, ID = 1 mA
4.6 V 4.0
0.24
98%
RDS (on)0.22
0.20 0.18 0.16 0.14 0.12 0.10 0.08 0.06 0.04 0.02 0.00 -60
VGS(th)
3.6 3.2 2.8 2.4
typ
2%
98% typ
2.0 1.6 1.2 0.8 0.4 0.0 -60 -20 20 60 100 C 160
-20
20
60
100
C
160
Tj
Tj
Typ. capacitances
C = f (VDS) parameter:VGS = 0V, f = 1MHz
10 1
Forward characteristics of reverse diode IF = (VSD) parameter: Tj , tp = 80 s
10 2
nF C 10 0
A
IF Ciss
10 1
Coss
10 -1
Crss
10 0
Tj = 25 C typ Tj = 150 C typ Tj = 25 C (98%) Tj = 150 C (98%)
10 -2 0 10 -1 0.0
5
10
15
20
25
30
V VDS
40
0.4
0.8
1.2
1.6
2.0
2.4
V
3.0
VSD
Semiconductor Group
7
01/97
BUZ 21
Avalanche energy EAS = (Tj ) parameter: ID = 21 A, VDD = 25 V RGS = 25 , L = 340 H
110 mJ
Typ. gate charge VGS = (QGate) parameter: ID puls = 36 A
16
V
EAS
90 80 70 60
VGS
12 0,2 VDS max 0,8 VDS max
10
8 50 40 30 20 2 10 0 20 0 40 60 80 100 120 C 160 0 10 20 30 40 50 nC 70 6
4
Tj
Q Gate
Drain-source breakdown voltage V(BR)DSS = (Tj )
120 V 116
V(BR)DSS 114
112 110 108 106 104 102 100 98 96 94 92 90 -60
-20
20
60
100
C
160
Tj
Semiconductor Group
8
01/97


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